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      Products & Solutions

      Jedec Tray Input Test Handler

      Designed with high speed rotary concept which pick ICs directly from trays, vision inspection and electrical test before output into tape/reel with auto replace capability.

      Description
      InputJedec Tray, Waffle Tray
      OutputTape & Reel with auto replace, Waffle tray
      Vision Systems2D, 3D, 5S, bottom pads, 6 sided, In-pocket. Micro-crack capable. Colour and mono camera. BGA Balls.
      No. of Test SiteUp to 16 sites
      Test Force (selectable)0.3kg - 3kg, Extraforce available up to 9kg. Real time test force display.
      Applicable PackagesWLCSP, QFN, QFP, BGA, SOIC & etc
      UPHUp to 30k depends on package type
      Test Socket & ContactorsKelvin Contact, Clamp Type, Flat Test (100 Ampere @ 1ms)
      Handler-Tester Comm.GPIB, TTL, RS232
      NetworkingSECS GEM